DTS 761 - Dynamik Test System
- Test system for use in production and quality assurance
- For determination of the dynamic characteristics of power semiconductors during development
- Static pre-test (reverse current and blocking voltage)
- Integrity test before and after each dynamic test
- Single and multiple pulse test of single and multiple modules on inductive load
- Check of short circuit characteristics
- 3-level-test to verify the dynamic characteristics
- Avalanche-test
- Gate voltage programmable
Merkmale
The DTS 761 is used to determine the dynamic characteristics of power semiconductors during switching operation.
The DTS 761 is able to test single modules (1 DUT + 1 reverse diode), half bridges, 3-phase bridges and 3-phase bridges plus brake as well as 3-level modules.
The system consists of several parts:
Control Box CB 722: Includes sequencing and implementation of test cycles as well as HW-monitoring and power supply up to 2000 V.
Test Head TH 761: Components for dynamic and integrity test, current measuring probes, input of static pre-test. It also contains the changeable power capacitor, Inductance and Gatedrivers.
Oscilloscope: Provides measurement data of switching operations on the DUT.
Static pre-test unit BVM 625: Check of blocking voltage and reverse current.
Universal Test Adapter and Device Handler TA 761: The DUT is placed on a hating plate. For testing it is loaded into the specific adapter and automatic reloaded when tested pass.
Industrial-PC: Control and analysis of measurements, connected via serial and accordingly network interface.
The Test Software offers manual, and automatic test modes with automatic pass / fail decisions on test data or curve limit rules.