Messsysteme zur Produktion

Was Ihnen unsere Geräte zur Produktion bieten

Messtechnik - unser Maßstab ist nicht das, was technisch machbar ist, sondern das, was für die Produktion sinnvoll ist. Praxistaugliche Lösungen für anspruchsvolle Messaufgaben von nA und µV bis kA und kV.

Produkte zur Produktion

TLW 813 - Lastwechselprüfstand


The TLW 820 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

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STS 805 - Static Test System


The STS measurement system is used to test power semiconductors and power semiconductor modules.

There are 70 freely usable power and sense connections abailable, which enable software-controlled...

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DQA 775 - Durchlass- und Gateladung mit Avalanche Test


The DQA 775 is used to measure on-state voltages and gate charges, as well as to test the avalanche behavior of MOSFETs.

To determine the forward voltage, the test object is operated with the set...

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DTS 761 - Dynamik Test System


The DTS 761 is used to determine the dynamic characteristics of power semiconductors during switching operation.

The DTS 761 is able to test single modules (1 DUT + 1 reverse diode), half bridges,...

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TPS 746 - Testsystem für statische Messungen an Leistungshalbleitermodulen


The test system TPS 625 or 746 is used to test power semiconductors.

The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...

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MU 746 - Messstellenumschalter


The multiplexer MU 746 is an essential component of the test system for power semiconductors TPS 746. It is used to connect the individual measurement devices of the system with the specimen (device...

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TSM 738 - Statik Test System


The TSM 738 enables the measurement of the common characteristics of power semiconductors with only one DUT contacting.

The system consists of maximum six components and can be varied depending on...

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BVM 738 - Sperrmessgerät für Leistungshalbleiter


The measurement instrument BVM 738 to investigate into the blocking characteristics of power semiconductors.

The device is designed for manual use as well as for integration in an automated...

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DVDT 736 - dv/dt-Generator und Prüfgerät


The DVDT 736 is used to test the stability of thyristors against dynamic transients. Therefore the DUT is run with a fast voltage slope and the ignition or non- ignition behavior is considered.

The...

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BVM 729 - Kennlinienmessgerät


The measurement instrument BVM 729 is used to investigate the blocking characteristics of power semiconductors. Peak voltages of up to 3,000 V are available at currents of up to 60 mA.

The BVM 729...

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SML 726 - Sperrspannungsmessgerät


The measurement instrument SML 726 to investigate into the blocking characteristics of power semiconductors. A peak voltage of -8,000 V at a current of up to 100 mA is available.

The device is...

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DM 725 - Durchlassmessgerät


The DM 725 is used to measure the forward voltage of power semiconductors.

The measuring device is designed for integration into an automated test system, so it offers neither displays nor manual...

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STS 717 - Statik Test System 717


  • Testing of power semiconductors and power semiconductor modules
  • All application areas of the individual devices
  • Reverse current measurement
  • Forward current measurement
  • Leakage current...

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DM 714 - Durchlassmessgerät (5000A)


The DM 714 is used to measure the forward voltage of power semiconductors.

The measuring device is designed for integration into an automated system, so it offers neither displays nor manual...

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KML 710 - Kennlinienmessgerät mit digitalem Sichtgerät


The KML 710 has been designed to test the blocking characteristics of power semiconductors. A peak voltage of up to 15 kV at a current of up to 200 mA is available.

The KML 710 offers manual control...

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LRT 703 - Resistance Tester for Fuse Production Line


The instrument LRT 703 is used to measure resistor ports in production lines, e. g. fuses.

The LRT 703 has a PLC-interface to be integrated into the sequencing of the production as well as an...

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WM 694 - Wärmewiderstandsmessgerät


The measuring instrument WM 694 realises the measurement of the thermal resistance of power semiconductors.

The measurement of the temperature increase in a pn- junction is enabled by the relatively...

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DM 678 - Durchlassmessgerät


The DM 678 is a combination of a forward voltage tester and a multiplexer and was developed for measuring the forward voltage in power semiconductor modules with up to 16 power connections.

In...

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GSG 664 - Gate-Stress-Generator


The Gate stress generator GSG 664 is used to stress power semiconductors, especially IGBTs, by a selection pulse.

Therefore the Gate of the DUT is loaded by voltage pulses. The test voltage is...

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TSM 664 - Testsystem für statische Messungen an Leistungshalbleitern


The TSM 664 is used in the testing of power semiconductors and power semiconductor modules with up to 9 high power terminals.

The test system consists of up to 6 components and is fully variable...

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SML 664 - Sperrmessgerät für Leistungshalbleiter


The measurement instrument SML 664 to investigate into the blocking characteristics of power semiconductors.

The device is designed for manual use as well as for integration in an automated...

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LRT 640 - Low Resistance Tester


The instrument LRT 640 is used to measure small electric resistors in production lines, e. g. fuses.

The LRT 640 has a PLC-interface to be integrated into the sequencing of the production as well as...

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ZEH 634 - Zünd-Einrast-Haltestrommessgerät


The instrument ZEH 634 is used for testing Thyristors.

The trigger characteristics of the gate, the latching current and the holding current in the anode circuit are measured:

1. **Gate Trigger...

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MLH 634 - Messgerät für Leistungshalbleiter


The tester for power semiconductors MLH 634 is designed for fast test and characterization of power semiconductors.

It offers all static parameter tests in one instrument. For application in a pick...

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IP 630 - Isolationsprüfgerät


The instrument IP 630 is used to investigate into the behaviour of isolation of electrical devices, e.g. DCB-ceramic of power semiconductors.

To implement isolation testing, the specimen is...

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IP 625 - Isolationsprüfgerät


The instrument IP 625 is used to investigate into the behaviour of isolation of electrical devices
(especially capacitive specimen), e.g. DCB-ceramic of power semiconductors.

To implement...

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BVM 625 - Sperrmessgerät


The instrument BVM 625 is used to investigate into the behavior of blocking voltage and reverse current of power semiconductors.

The blocking voltage measurement is implemented by increasing the...

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FVM 625 - Durchlassmessgerät


The instrument FVM 625 is used to investigate into the behaviour of forward voltage of power semiconductors.

The forward voltage measurement is implemented by testing the specimen for a certain time...

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LCM 625 - Leckstrommessgerät


The measuring device for leakage currents LCM 625 is used for measuring the gate leakage currents of MOS-transistors and IGBTs during production (series measurement).

Due to accelerate the...

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MU 625 - Messstellenumschalter


The MU 625 is an essential component of our measuring system for power semiconductors TPS 625.

It is used to connect the individual measuring devices with the specimen.

In addition, some system...

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TPS 625 - Testsystem für Leistungshalbleiter


The test system TPS 625 or 746 is used to test power semiconductors.

The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...

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DT 616 - Diodentestgerät


The DT 616 tester is used for series measurement of diodes. It enables the testing of standard diodes, uni­polar and bipolar Zener diodes:

1. Forward voltage VF

The voltage drop at the DUT...

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KTM 604 - Kapazitätsmessbrücke für Leistungskondensatoren


The measuring bridge KTM 604 A is used for capacity measurement of power capacitors at 50 Hz and nominal voltage.

Measuring ranges are depending on the adjusted voltage range:

1 - 400 µF (100 -...

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