The TLW 820 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TLW 820 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The TLW 800 test system is used to observe the behavior of IGBT modules, diodes, and MOSFET modules for variable loads and the junction temperature of the components in a long-term test.

In this...

The DQA 775 is used to measure on-state voltages and gate charges, as well as to test the avalanche behavior of MOSFETs.

To determine the forward voltage, the test object is operated with the set...

The TLW 763 has been designed to verify the characteristics of power IGBT, MOSFET and diode modules used in power electronics during long term life cycle testing.

Testing is implemented with forward...

The test system ZTH 749 is designed to measure the thermal resistance within power semiconductors devices.

The measurement of the temperature increase in a pn- junction is enabled by the relatively...

The test system TPS 625 or 746 is used to test power semiconductors.

The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...

The multiplexer MU 746 is an essential component of the test system for power semiconductors TPS 746. It is used to connect the individual measurement devices of the system with the specimen (device...

The TLW 739 has been designed to verify the life cycle characteristics of up to 18 power semiconductor devices (IGBT, MOSFET, Thyristor and diode).

Testing is implemented with forward load current...

The TSM 738 enables the measurement of the common characteristics of power semiconductors with only one DUT contacting.

The system consists of maximum six components and can be varied depending on...

The measurement instrument BVM 738 to investigate into the blocking characteristics of power semiconductors.

The device is designed for manual use as well as for integration in an automated...

The measurement unit DM 736 is used to measure the forward voltage of power semiconductors.

The device was designed for integration into an automated test system and has therefore neither manual...

The measurement instrument BVM 729 is used to investigate the blocking characteristics of power semiconductors. Peak voltages of up to 3,000 V are available at currents of up to 60 mA.

The BVM 729...

The measurement instrument SML 726 to investigate into the blocking characteristics of power semiconductors. A peak voltage of -8,000 V at a current of up to 100 mA is available.

The device is...

The DM 725 is used to measure the forward voltage of power semiconductors.

The measuring device is designed for integration into an automated test system, so it offers neither displays nor manual...

• Testing of power semiconductors and power semiconductor modules
• All application areas of the individual devices
• Reverse current measurement
• Forward current measurement
• Leakage current...

The DM 714 is used to measure the forward voltage of power semiconductors.

The measuring device is designed for integration into an automated system, so it offers neither displays nor manual...

The instrument LRT 703 is used to measure resistor ports in production lines, e. g. fuses.

The LRT 703 has a PLC-interface to be integrated into the sequencing of the production as well as an...

The measuring instrument WM 694 realises the measurement of the thermal resistance of power semiconductors.

The measurement of the temperature increase in a pn- junction is enabled by the relatively...

The test system HTRB 689 is used for determination of the robustness and long term stability of diodes and IGBT modules under high temperature reverse bias condition.

The minimum system consists of...

The Gate stress generator GSG 664 is used to stress power semiconductors, especially IGBTs, by a selection pulse.

Therefore the Gate of the DUT is loaded by voltage pulses. The test voltage is...

The TSM 664 is used in the testing of power semiconductors and power semiconductor modules with up to 9 high power terminals.

The test system consists of up to 6 components and is fully variable...

The measurement instrument SML 664 to investigate into the blocking characteristics of power semiconductors.

The device is designed for manual use as well as for integration in an automated...

The forward voltage measuring device DM 659 is developed for the measurement of the forward voltage of power semiconductors and of the output and transfer characteristics of IGBTs. The DM 659 is...

The instrument LRT 640 is used to measure small electric resistors in production lines, e. g. fuses.

The LRT 640 has a PLC-interface to be integrated into the sequencing of the production as well as...

The instrument ZEH 634 is used for testing Thyristors.

The trigger characteristics of the gate, the latching current and the holding current in the anode circuit are measured:

1. **Gate Trigger...

The tester for power semiconductors MLH 634 is designed for fast test and characterization of power semiconductors.

It offers all static parameter tests in one instrument. For application in a pick...

The instrument IP 630 is used to investigate into the behaviour of isolation of electrical devices, e.g. DCB-ceramic of power semiconductors.

To implement isolation testing, the specimen is...

The instrument IP 625 is used to investigate into the behaviour of isolation of electrical devices
(especially capacitive specimen), e.g. DCB-ceramic of power semiconductors.

To implement...

The instrument BVM 625 is used to investigate into the behavior of blocking voltage and reverse current of power semiconductors.

The blocking voltage measurement is implemented by increasing the...

The instrument FVM 625 is used to investigate into the behaviour of forward voltage of power semiconductors.

The forward voltage measurement is implemented by testing the specimen for a certain time...

The measuring device for leakage currents LCM 625 is used for measuring the gate leakage currents of MOS-transistors and IGBTs during production (series measurement).

Due to accelerate the...

The test system TPS 625 or 746 is used to test power semiconductors.

The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact...

The DT 616 tester is used for series measurement of diodes. It enables the testing of standard diodes, uni­polar and bipolar Zener diodes:

1. Forward voltage VF

The voltage drop at the DUT...

The measuring bridge KTM 604 A is used for capacity measurement of power capacitors at 50 Hz and nominal voltage.

Measuring ranges are depending on the adjusted voltage range:

1 - 400 µF (100 -...