HTRB 689 - HTRB-Prüfstand
- Research into the behaviour of devices in development and application
- Test of the ability of specimens to withstand reverse bias being subjected to the maximum ambient temperature possible without damage
- Test voltage up to ± 2,000 V
- Measurement of 18 single specimens or 9 half bridge modules on 3 heating places
- Bias current measurement up to 300 mA per channel
- Temperature measurement and control up to 200° C
- Three different operation modes: half-wave (50 Hz), half-wave (100 Hz) and smoothed half-wave (100 Hz)
- Effective sample rate: 50Hz/13samples
Merkmale
The test system HTRB 689 is used for determination of the robustness and long term stability of diodes and IGBT modules under high temperature reverse bias condition.
The minimum system consists of one basic station and a PC and can be extended to more than ten stations. Each station includes the bias voltage generator, the measurement section for bias current (up to 18 channels) and temperature (up to 9 channels) and the control unit for automated long-term tests. The test system can only be operated at the PC, connected via network interface.
The temperature is measured by special sensors directly at the bottom panel of the specimen.
The system has three operation modes: half-wave at 50 Hz, half-wave at 100 Hz (full-wave rectification) and smoothed half-wave at 100 Hz.
A measuring cycle includes the measurement of the maximum bias current of each module, the summation current and the voltage. This lasts 260 ms (13 full-waves) and is rerun permanently until either the adjusted loading time is expired or a limit value is exceeded.
The HTRB 689 offers a program to measure different specimens and to analyse and save the results easily. The user defines how often the results will be saved during the loading time. Each station of the system can be controlled separately.