The tester for power semiconductors MLH 634 is designed for fast test and characterization of power semiconductors.
It offers all static parameter tests in one instrument. For application in a pick & place-system an extra function test and a gate threshold measurement are available.
A parallel regulator prevents the output voltage or the DUT current from exceeding an adjusted limit.
For laboratory and maintenance use, it can be controlled by hand. For automatic measurements, it is prepared with a serial interface, compatible with standard PC-Hardware.
For laboratory and maintenance use, it can be controlled by hand. For automatic measurements, it is prepared with a serial interface, compatible with standard PC – Hardware.
A comfortable measuring program allows easy design of measuring routines up to result depending classification of test objects.
To connect other measurement instruments to the MLH 634, a multiplexer has been integrated. Extended with a Gate Leakage Tester and a Thyristor Ignition Tester, it offers the measurement solution for the most common used test requirements of Thyristors, MOS-FETs and IGBTs.