The multiplexer MU 746 is an essential component of the test system for power semiconductors TPS 746. It is used to connect the individual measurement devices of the system with the specimen (device under test DUT).

The multiplexer is designed for an integration into an automated test system and thus is not equipped with displays and manual controls.

There are optionally 8 to 64 channels available; each consists of one load current, one sense and two gate terminals.

The switch over of the load current path is implemented by high-current relays, which are designed for a continuous load current of 30 A, a peak current of 600 A (2 ms) and a dielectric strength of 4,000 V.

The DUT connections are situated on the front, the measuring device connections are on the back.

The multiplexer is fully structured in Kelvin contact measurement method.

To measure IGBTs, gate short-circuit relays and a so-called “common source” circuit are integrated (IGBTs with a common emitter).

In addition, a universal current source and a voltage measuring unit are integrated, which are used for resistance measurements and contact testing.