STS 717 - Statik Test System 717
- Testing of power semiconductors and power semiconductor modules
- All application areas of the individual devices
- Reverse current measurement
- Forward current measurement
- Leakage current measurement
- Gate stress generator
- Modular test system for testing static characteristics of power semiconductors in production and quality control applications
- Extensive, freely configurable circuit matrix, built with 70 power and 70 sense channels
- Support of the typical measurement methods for diodes, thyristors, IGBTs, MOS-FET and SIC-Mos
- Modular generator concept for easy adaptation to special requirements
- Standard measurement devices and generators up to 1,400 A at 40 V and 3,000 V at 20 mA
- Clearly structured operating program for programming measurement starts and for production batches protocols
- Including calibration module for easy traceability
Merkmale
- Testing of power semiconductors and power semiconductor modules
- All application areas of the individual devices
- Reverse current measurement
- Forward current measurement
- Leakage current measurement
- Gate stress generator