TLW 800 - Lastwechselprüfstand
- Lifecycle testing in design and quality control applications
- Investigation of the Rth changes during lifecycle testing
- For research applications into the behavioural characteristics during development and in design verification
- Component qualification according to AQG 324
- Load current generation up to 800 A
- 36 measurement stations, arranged in 3 chains with 12 DUTs each
- Measurement current source to
- max. 500 mA
- Temperature measurement on 18 test stations with heating and cooling plates, arranged in 3 identical lines for 6 test units each
- Maximum permissible temperature 200°C
- 36 thermal element inputs type K
- (two per test station)
- 3 cooling systems of which each chain is manually adjustable
- Control for automatic execution of endurance tests and data recording
- Integrated network interface for accessing test results remotely
Merkmale
The TLW 800 test system is used to observe the behavior of IGBT modules, diodes, and MOSFET modules for variable loads and the junction temperature of the components in a long-term test.
In this test, a high forward current is alternately switched on and off, causing high periodic changes in the temperature and temperature gradient of the test subject.
Such prolonged overloads can lead to changes in the semiconductor, which are manifested in an increase of the forward voltage,
changes in the thermal resistance, and loss of gate controllability (damage to soldered connections, loosening of connections).
Test result data is saved to the rack mounted PC and can be exported for further analysis.
The option of sending emails to a given address sends immediate notifications in the event of measurement interruptions, allowing the operator to act promptly, which in turn reduces the system downtime.