TPS 625 - Testsystem für Leistungshalbleiter
Classification of semiconductor packages
- Measurement of common static characteristics of power semiconductors
- Measurement of semiconductor packages with up to 64 main current paths
- Modular equipment construction of separate measuring devices
- Comfortable measuring software for integration into automatic test systems or automatically measuring by manually specimen feeding
- Supports up to 10 measuring fixtures for quasi parallel measurement
- Optional including calibration package with test device and calibration references for self-tests
Merkmale
The test system TPS 625 or 746 is used to test power semiconductors.
The TPS 625 enables the measurement of the common characteristics of power semiconductors with only one DUT contact assignment.
The system consists of maximum six components and can be varied depending on requirements. The standard equipment is intended to measure modules at up to 64 high current terminals and consists of the following components:
Trigger, ignition and holding current tester ZEH 634
Leakage current measurement unit LCM 625
Blocking voltage measurement unit BVM 625
Forward voltage measurement unit FVM 625
Multiplexer MU 625 / MU 746
The test system is controlled via serial interface. The comfortable measuring software allows the easy construction of measurement procedures and even the result-related classification of the DUTs.
· Testing of power semiconductors in development, production and quality assurance